Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9851313 | Quantitative X-ray analysis—ratio correction | Charalampos Zarkadas | 2017-12-26 |
| 9784699 | Quantitative X-ray analysis—matrix thickness correction | Charalampos Zarkadas, Milen Gateshki, Alexander Kharchenko, Petronella Emerentiana Hegeman, Dick Kuiper | 2017-10-10 |
| 9739730 | Quantitative X-ray analysis—multi optical path instrument | Petronella Emerentiana Hegeman, Gustaaf Christian Brons, Aleksandr Komelkov, Bruno A. R. Vrebos, Charalampos Zarkadas | 2017-08-22 |
| 7247854 | Limiting device for electromagnetic radiation, notably in an analysis device | Jan Boldewijn | 2007-07-24 |
| 7194067 | X-ray optical system | Hendrik Adrianus Van Sprang | 2007-03-20 |
| 6393093 | X-ray analysis apparatus with an X-ray detector in the form of a CCD array | Johannes C. Jans, Marinus Willem Dirken | 2002-05-21 |
| 6310937 | X-ray diffraction apparatus with an x-ray optical reference channel | — | 2001-10-30 |
| 5622525 | Method of polishing a surface of copper or an alloy comprising mainly copper | Jan Haisma, Peter W. De Haas, Dirk Kornelis Gerhardus De Boer, Lambertus Postma | 1997-04-22 |
| 4379251 | Cathode-ray tube | Marcel Brouha, Peter C. Van Loosdregt | 1983-04-05 |