Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12031925 | Adaptable X-ray analysis apparatus | Detlef Beckers, Milen Gateshki | 2024-07-09 |
| 12007343 | X-ray beam shaping apparatus and method | Milen Gateshki, Detlef Beckers, Nicholas Norberg | 2024-06-11 |
| 10753890 | High resolution X-ray diffraction method and apparatus | Detlef Beckers, Milen Gateshki, Eugene Reuvekamp | 2020-08-25 |
| 9784699 | Quantitative X-ray analysis—matrix thickness correction | Charalampos Zarkadas, Milen Gateshki, Waltherus Van Den Hoogenhof, Petronella Emerentiana Hegeman, Dick Kuiper | 2017-10-10 |
| 7978820 | X-ray diffraction and fluorescence | Roger Meier, Walter van den Hoogenhof | 2011-07-12 |
| 7116754 | Diffractometer | Klaus Lischka | 2006-10-03 |