Issued Patents All Time
Showing 1–11 of 11 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12405234 | Sample holder for an X-ray analysis apparatus | Detlef Beckers, Jan Vugteveen | 2025-09-02 |
| 12031925 | Adaptable X-ray analysis apparatus | Detlef Beckers, Alexander Kharchenko | 2024-07-09 |
| 12007343 | X-ray beam shaping apparatus and method | Alexander Kharchenko, Detlef Beckers, Nicholas Norberg | 2024-06-11 |
| 11035805 | X-ray analysis apparatus and method | Detlef Beckers, Jaap Boksem | 2021-06-15 |
| 10900912 | X-ray analysis apparatus | Detlef Beckers, Jaap Boksem, Fabio Masiello | 2021-01-26 |
| 10782252 | Apparatus and method for X-ray analysis with hybrid control of beam divergence | Detlef Beckers | 2020-09-22 |
| 10753890 | High resolution X-ray diffraction method and apparatus | Detlef Beckers, Alexander Kharchenko, Eugene Reuvekamp | 2020-08-25 |
| 10352881 | Computed tomography | Detlef Beckers | 2019-07-16 |
| 9784699 | Quantitative X-ray analysis—matrix thickness correction | Charalampos Zarkadas, Alexander Kharchenko, Waltherus Van Den Hoogenhof, Petronella Emerentiana Hegeman, Dick Kuiper | 2017-10-10 |
| 9506880 | Diffraction imaging | Detlef Beckers | 2016-11-29 |
| 9110003 | Microdiffraction | Detlef Beckers | 2015-08-18 |