Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date | Approx Value ⓘ |
|---|---|---|---|---|
| 12044727 | Probes for electrical testing in defect detection systems | Tal Goichman, Ashkan Aghajani | 2024-07-23 | |
| 8466542 | Stacked microelectronic assemblies having vias extending through bond pads | Moshe Kriman, Osher Avsian, Belgacem Haba, Giles Humpston | 2013-06-18 | $1,724,000 |