| 9229045 |
In-situ characterization of a solid-state light source |
David K. McElfresh, Dan Vacar, Kenny C. Gross |
2016-01-05 |
| 8798944 |
Estimating ball-grid-array longevity in a computer system |
Aleksey M. Urmanov, Anton A. Bougaev, David K. McElfresh |
2014-08-05 |
| 8155765 |
Estimating relative humidity inside a computer system |
Kenny C. Gross, Kalyanaraman Vaidyanathan |
2012-04-10 |
| 8140277 |
Enhanced characterization of electrical connection degradation |
David K. McElfresh, Kenny C. Gross, Dan Vacar |
2012-03-20 |
| 7982468 |
Apparatus and method for testing electrical interconnects with switches |
Dan Vacar, David K. McElfresh, Robert H. Melanson |
2011-07-19 |
| 7870440 |
Method and apparatus for detecting multiple anomalies in a cluster of components |
Dan Vacar, David K. McElfresh, Kenny C. Gross |
2011-01-11 |
| 7800385 |
Apparatus and method for testing electrical interconnects |
David K. McElfresh, Dan Vacar, Robert H. Melanson |
2010-09-21 |
| 7680624 |
Method and apparatus for performing a real-time root-cause analysis by analyzing degrading telemetry signals |
David K. McElfresh, Dan Vacar, Kenny C. Gross |
2010-03-16 |
| 7466404 |
Technique for diagnosing and screening optical interconnect light sources |
Dan Vacar, David K. McElfresh, Robert H. Melanson |
2008-12-16 |
| 7353431 |
Method and apparatus for proactive fault monitoring in interconnects |
David K. McElfresh, Dan Vacar, Kenny C. Gross |
2008-04-01 |
| 7283919 |
Determining the quality and reliability of a component by monitoring dynamic variables |
Kenny C. Gross, Dan Vacar, David K. McElfresh |
2007-10-16 |
| 7216062 |
Characterizing degradation of components during reliability-evaluation studies |
Dan Vacar, David K. McElfresh, Kenny C. Gross |
2007-05-08 |
| 7184932 |
Reliability prediction for complex components |
David K. McElfresh, Dan Vacar |
2007-02-27 |
| 7162393 |
Detecting degradation of components during reliability-evaluation studies |
Dan Vacar, Kenny C. Gross, David K. McElfresh |
2007-01-09 |
