Issued Patents All Time
Showing 1–14 of 14 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9229045 | In-situ characterization of a solid-state light source | David K. McElfresh, Dan Vacar, Kenny C. Gross | 2016-01-05 |
| 8798944 | Estimating ball-grid-array longevity in a computer system | Aleksey M. Urmanov, Anton A. Bougaev, David K. McElfresh | 2014-08-05 |
| 8155765 | Estimating relative humidity inside a computer system | Kenny C. Gross, Kalyanaraman Vaidyanathan | 2012-04-10 |
| 8140277 | Enhanced characterization of electrical connection degradation | David K. McElfresh, Kenny C. Gross, Dan Vacar | 2012-03-20 |
| 7982468 | Apparatus and method for testing electrical interconnects with switches | Dan Vacar, David K. McElfresh, Robert H. Melanson | 2011-07-19 |
| 7870440 | Method and apparatus for detecting multiple anomalies in a cluster of components | Dan Vacar, David K. McElfresh, Kenny C. Gross | 2011-01-11 |
| 7800385 | Apparatus and method for testing electrical interconnects | David K. McElfresh, Dan Vacar, Robert H. Melanson | 2010-09-21 |
| 7680624 | Method and apparatus for performing a real-time root-cause analysis by analyzing degrading telemetry signals | David K. McElfresh, Dan Vacar, Kenny C. Gross | 2010-03-16 |
| 7466404 | Technique for diagnosing and screening optical interconnect light sources | Dan Vacar, David K. McElfresh, Robert H. Melanson | 2008-12-16 |
| 7353431 | Method and apparatus for proactive fault monitoring in interconnects | David K. McElfresh, Dan Vacar, Kenny C. Gross | 2008-04-01 |
| 7283919 | Determining the quality and reliability of a component by monitoring dynamic variables | Kenny C. Gross, Dan Vacar, David K. McElfresh | 2007-10-16 |
| 7216062 | Characterizing degradation of components during reliability-evaluation studies | Dan Vacar, David K. McElfresh, Kenny C. Gross | 2007-05-08 |
| 7184932 | Reliability prediction for complex components | David K. McElfresh, Dan Vacar | 2007-02-27 |
| 7162393 | Detecting degradation of components during reliability-evaluation studies | Dan Vacar, Kenny C. Gross, David K. McElfresh | 2007-01-09 |