Issued Patents All Time
Showing 1–17 of 17 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9229045 | In-situ characterization of a solid-state light source | David K. McElfresh, Leoncio D. Lopez, Kenny C. Gross | 2016-01-05 |
| 8140277 | Enhanced characterization of electrical connection degradation | David K. McElfresh, Kenny C. Gross, Leoncio D. Lopez | 2012-03-20 |
| 7982468 | Apparatus and method for testing electrical interconnects with switches | David K. McElfresh, Robert H. Melanson, Leoncio D. Lopez | 2011-07-19 |
| 7920986 | Surface shape metric and method to quantify the surface shape of electronic packages | David K. McElfresh, Anton A. Bougaev, Donald A. Kearns, Charles E. Kinney | 2011-04-05 |
| 7890278 | Characterizing the response of a device in a computer system to vibration over a frequency range | Anton A. Bougaev, David K. McElfresh, Kenny C. Gross | 2011-02-15 |
| 7870440 | Method and apparatus for detecting multiple anomalies in a cluster of components | David K. McElfresh, Kenny C. Gross, Leoncio D. Lopez | 2011-01-11 |
| 7800385 | Apparatus and method for testing electrical interconnects | David K. McElfresh, Robert H. Melanson, Leoncio D. Lopez | 2010-09-21 |
| 7680624 | Method and apparatus for performing a real-time root-cause analysis by analyzing degrading telemetry signals | David K. McElfresh, Kenny C. Gross, Leoncio D. Lopez | 2010-03-16 |
| 7668696 | Method and apparatus for monitoring the health of a computer system | Kenny C. Gross, David K. McElfresh | 2010-02-23 |
| 7577542 | Method and apparatus for dynamically adjusting the resolution of telemetry signals | David K. McElfresh, Kenny C. Gross | 2009-08-18 |
| 7466404 | Technique for diagnosing and screening optical interconnect light sources | David K. McElfresh, Leoncio D. Lopez, Robert H. Melanson | 2008-12-16 |
| 7353431 | Method and apparatus for proactive fault monitoring in interconnects | Leoncio D. Lopez, David K. McElfresh, Kenny C. Gross | 2008-04-01 |
| 7330325 | Proactive fault monitoring of disk drives through phase-sensitive surveillance | David K. McElfresh, Kenny C. Gross, Aleksey M. Urmanov | 2008-02-12 |
| 7283919 | Determining the quality and reliability of a component by monitoring dynamic variables | Kenny C. Gross, Leoncio D. Lopez, David K. McElfresh | 2007-10-16 |
| 7216062 | Characterizing degradation of components during reliability-evaluation studies | David K. McElfresh, Kenny C. Gross, Leoncio D. Lopez | 2007-05-08 |
| 7184932 | Reliability prediction for complex components | Leoncio D. Lopez, David K. McElfresh | 2007-02-27 |
| 7162393 | Detecting degradation of components during reliability-evaluation studies | Kenny C. Gross, David K. McElfresh, Leoncio D. Lopez | 2007-01-09 |