| 9229045 |
In-situ characterization of a solid-state light source |
David K. McElfresh, Leoncio D. Lopez, Kenny C. Gross |
2016-01-05 |
| 8140277 |
Enhanced characterization of electrical connection degradation |
David K. McElfresh, Kenny C. Gross, Leoncio D. Lopez |
2012-03-20 |
| 7982468 |
Apparatus and method for testing electrical interconnects with switches |
David K. McElfresh, Robert H. Melanson, Leoncio D. Lopez |
2011-07-19 |
| 7920986 |
Surface shape metric and method to quantify the surface shape of electronic packages |
David K. McElfresh, Anton A. Bougaev, Donald A. Kearns, Charles E. Kinney |
2011-04-05 |
| 7890278 |
Characterizing the response of a device in a computer system to vibration over a frequency range |
Anton A. Bougaev, David K. McElfresh, Kenny C. Gross |
2011-02-15 |
| 7870440 |
Method and apparatus for detecting multiple anomalies in a cluster of components |
David K. McElfresh, Kenny C. Gross, Leoncio D. Lopez |
2011-01-11 |
| 7800385 |
Apparatus and method for testing electrical interconnects |
David K. McElfresh, Robert H. Melanson, Leoncio D. Lopez |
2010-09-21 |
| 7680624 |
Method and apparatus for performing a real-time root-cause analysis by analyzing degrading telemetry signals |
David K. McElfresh, Kenny C. Gross, Leoncio D. Lopez |
2010-03-16 |
| 7668696 |
Method and apparatus for monitoring the health of a computer system |
Kenny C. Gross, David K. McElfresh |
2010-02-23 |
| 7577542 |
Method and apparatus for dynamically adjusting the resolution of telemetry signals |
David K. McElfresh, Kenny C. Gross |
2009-08-18 |
| 7466404 |
Technique for diagnosing and screening optical interconnect light sources |
David K. McElfresh, Leoncio D. Lopez, Robert H. Melanson |
2008-12-16 |
| 7353431 |
Method and apparatus for proactive fault monitoring in interconnects |
Leoncio D. Lopez, David K. McElfresh, Kenny C. Gross |
2008-04-01 |
| 7330325 |
Proactive fault monitoring of disk drives through phase-sensitive surveillance |
David K. McElfresh, Kenny C. Gross, Aleksey M. Urmanov |
2008-02-12 |
| 7283919 |
Determining the quality and reliability of a component by monitoring dynamic variables |
Kenny C. Gross, Leoncio D. Lopez, David K. McElfresh |
2007-10-16 |
| 7216062 |
Characterizing degradation of components during reliability-evaluation studies |
David K. McElfresh, Kenny C. Gross, Leoncio D. Lopez |
2007-05-08 |
| 7184932 |
Reliability prediction for complex components |
Leoncio D. Lopez, David K. McElfresh |
2007-02-27 |
| 7162393 |
Detecting degradation of components during reliability-evaluation studies |
Kenny C. Gross, David K. McElfresh, Leoncio D. Lopez |
2007-01-09 |
