Issued Patents All Time
Showing 1–11 of 11 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7869644 | Methods of and apparatus for inspecting substrate | Kiyoshi Murakami, Masato Ishiba, Jun Kuriyama | 2011-01-11 |
| 7680320 | Image processing method, substrate inspection method, substrate inspection apparatus and method of generating substrate inspection data | Kiyoshi Murakami, Masato Ishiba | 2010-03-16 |
| 7512260 | Substrate inspection method and apparatus | Kiyoshi Murakami, Yasunori ASANO, Takashi Kinoshita | 2009-03-31 |
| 7505149 | Apparatus for surface inspection and method and apparatus for inspecting substrate | Masato Ishiba, Jun Kuriyama, Kiyoshi Murakami | 2009-03-17 |
| 7394084 | Method of generating image and illumination device for inspecting substrate | Jun Kuriyama, Masato Ishiba, Kiyoshi Murakami | 2008-07-01 |
| 7310406 | Inspection method and system for and method of producing component mounting substrate | Jun Kuriyama, Masato Ishiba, Kiyoshi Murakami | 2007-12-18 |
| 5245671 | Apparatus for inspecting printed circuit boards and the like, and method of operating same | Shigeki Kobayashi, Yasuaki Tanimura | 1993-09-14 |
| 5093797 | Apparatus for inspecting packaged electronic device | Shigeki Kobayashi, Yasuaki Tanimura | 1992-03-03 |
| 5027295 | Apparatus for inspecting packaged electronic device | — | 1991-06-25 |
| 4953100 | Apparatus for inspecting packaged electronic device | — | 1990-08-28 |
| 4894790 | Input method for reference printed circuit board assembly data to an image processing printed circuit board assembly automatic inspection apparatus | Hideaki Takahara | 1990-01-16 |