Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7869644 | Methods of and apparatus for inspecting substrate | Kiyoshi Murakami, Jun Kuriyama, Teruhisa Yotsuya | 2011-01-11 |
| 7680320 | Image processing method, substrate inspection method, substrate inspection apparatus and method of generating substrate inspection data | Kiyoshi Murakami, Teruhisa Yotsuya | 2010-03-16 |
| 7505149 | Apparatus for surface inspection and method and apparatus for inspecting substrate | Jun Kuriyama, Kiyoshi Murakami, Teruhisa Yotsuya | 2009-03-17 |
| 7394084 | Method of generating image and illumination device for inspecting substrate | Jun Kuriyama, Kiyoshi Murakami, Teruhisa Yotsuya | 2008-07-01 |
| 7310406 | Inspection method and system for and method of producing component mounting substrate | Jun Kuriyama, Kiyoshi Murakami, Teruhisa Yotsuya | 2007-12-18 |