KM

Kiyoshi Murakami

OM Omron: 10 patents #250 of 3,089Top 9%
MC Moriroku Technology Company: 2 patents #5 of 25Top 20%
MC Mitsui & Co.: 1 patents #15 of 67Top 25%
UN Unknown: 1 patents #29,356 of 83,584Top 40%
GE: 1 patents #19,878 of 36,430Top 55%
Overall (All Time): #346,012 of 4,157,543Top 9%
14
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
11180065 Beverage container holding device 2021-11-23
9783131 Decorated molded article 2017-10-10
9552803 Communication method, communication system, and magnetic resonance apparatus Yasuyuki Innami, Shohei Kimoto, Yuya Mizobe, Yusuke Asaba 2017-01-24
8351682 X-ray examination region setting method, X-ray examination apparatus and X-ray examination region setting program Hideyuki Hayashi, Kunio Yoshida 2013-01-08
7869644 Methods of and apparatus for inspecting substrate Masato Ishiba, Jun Kuriyama, Teruhisa Yotsuya 2011-01-11
7822566 Method, device and program for setting a reference value for substrate inspection 2010-10-26
7680320 Image processing method, substrate inspection method, substrate inspection apparatus and method of generating substrate inspection data Masato Ishiba, Teruhisa Yotsuya 2010-03-16
7512260 Substrate inspection method and apparatus Yasunori ASANO, Takashi Kinoshita, Teruhisa Yotsuya 2009-03-31
7505149 Apparatus for surface inspection and method and apparatus for inspecting substrate Masato Ishiba, Jun Kuriyama, Teruhisa Yotsuya 2009-03-17
7394084 Method of generating image and illumination device for inspecting substrate Jun Kuriyama, Masato Ishiba, Teruhisa Yotsuya 2008-07-01
7310406 Inspection method and system for and method of producing component mounting substrate Jun Kuriyama, Masato Ishiba, Teruhisa Yotsuya 2007-12-18
7114249 Substrate inspecting method and substrate inspecting apparatus using the method 2006-10-03
6947151 Surface state inspecting method and substrate inspecting apparatus Yoshiki Fujii 2005-09-20
5674914 Method and apparatus for reclamation of waste polyvinyl chloride Masakazu Abe 1997-10-07