Issued Patents All Time
Showing 1–14 of 14 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11180065 | Beverage container holding device | — | 2021-11-23 |
| 9783131 | Decorated molded article | — | 2017-10-10 |
| 9552803 | Communication method, communication system, and magnetic resonance apparatus | Yasuyuki Innami, Shohei Kimoto, Yuya Mizobe, Yusuke Asaba | 2017-01-24 |
| 8351682 | X-ray examination region setting method, X-ray examination apparatus and X-ray examination region setting program | Hideyuki Hayashi, Kunio Yoshida | 2013-01-08 |
| 7869644 | Methods of and apparatus for inspecting substrate | Masato Ishiba, Jun Kuriyama, Teruhisa Yotsuya | 2011-01-11 |
| 7822566 | Method, device and program for setting a reference value for substrate inspection | — | 2010-10-26 |
| 7680320 | Image processing method, substrate inspection method, substrate inspection apparatus and method of generating substrate inspection data | Masato Ishiba, Teruhisa Yotsuya | 2010-03-16 |
| 7512260 | Substrate inspection method and apparatus | Yasunori ASANO, Takashi Kinoshita, Teruhisa Yotsuya | 2009-03-31 |
| 7505149 | Apparatus for surface inspection and method and apparatus for inspecting substrate | Masato Ishiba, Jun Kuriyama, Teruhisa Yotsuya | 2009-03-17 |
| 7394084 | Method of generating image and illumination device for inspecting substrate | Jun Kuriyama, Masato Ishiba, Teruhisa Yotsuya | 2008-07-01 |
| 7310406 | Inspection method and system for and method of producing component mounting substrate | Jun Kuriyama, Masato Ishiba, Teruhisa Yotsuya | 2007-12-18 |
| 7114249 | Substrate inspecting method and substrate inspecting apparatus using the method | — | 2006-10-03 |
| 6947151 | Surface state inspecting method and substrate inspecting apparatus | Yoshiki Fujii | 2005-09-20 |
| 5674914 | Method and apparatus for reclamation of waste polyvinyl chloride | Masakazu Abe | 1997-10-07 |