Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11821946 | Built in self test (BIST) for clock generation circuitry | Anurag Jindal | 2023-11-21 |
| 11769567 | Devices and methods for preventing errors and detecting faults within a memory device | Jehoda Refaeli, Glenn C. Abeln | 2023-09-26 |