Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10417104 | Data processing system with built-in self-test and method therefor | Colin MacDonald, Alexander B. Hoefler, Jose A. Lyon, Andrew Payne | 2019-09-17 |
| 9645963 | Systems and methods for concurrently testing master and slave devices in a system on a chip | Chris N. Stoll, George R. Redford, Jayson D. Vogler, Khurram Waheed | 2017-05-09 |
| 9412467 | Semiconductor device having a test controller and method of operation | Stephen F. McGinty | 2016-08-09 |