Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10417104 | Data processing system with built-in self-test and method therefor | Colin MacDonald, Alexander B. Hoefler, Chris P. Nappi, Andrew Payne | 2019-09-17 |
| 10386413 | Circuit and method for testing flip flop state retention | Andrew Payne, Colin MacDonald | 2019-08-20 |
| 7444568 | Method and apparatus for testing a data processing system | Gary R. Morrison, William C. Moyer, Anthony M. Reipold | 2008-10-28 |
| 7200056 | Memory row/column replacement in an integrated circuit | Paul M. Gelencser | 2007-04-03 |
| 5485466 | Method and apparatus for performing dual scan path testing of an array in a data processing system | Tony Cheng, Anthony M. Reipold, Eric Hoang | 1996-01-16 |
| 5276857 | Data processing system with shared control signals and a state machine controlled clock | Eytan Hartung, Michael E. Gladden | 1994-01-04 |
| 5185607 | Method and apparatus for testing an analog to digital converter | Jules D. Campbell, Jr. | 1993-02-09 |
| 5175547 | Method and apparatus for testing an analog to digital converter | Jules D. Campbell, Jr. | 1992-12-29 |
| 4972144 | Testable multiple channel decoder | Paul D. Shannon | 1990-11-20 |