Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8829940 | Method for testing a partially assembled multi-die device, integrated circuit die and multi-die device | Fransciscus Geradus Marie de Jong | 2014-09-09 |
| 8653847 | Testable integrated circuit, system in package and test instruction set | Fransciscus G. M. De Jong | 2014-02-18 |
| 7948243 | Testable integrated circuit, system in package and test instruction set | Fransciscus G. M. De Jong | 2011-05-24 |
| 6883129 | Electronic circuit and method for testing | Leon Van De Logt, Franciscus Gerardus Maria De Jong, Guillaume E. A. Lousberg | 2005-04-19 |