FJ

Fransciscus Geradus Marie de Jong

NB Nxp B.V.: 1 patents #1,722 of 3,591Top 50%
📍 Valkenswaard, NL: #96 of 180 inventorsTop 55%
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Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
8829940 Method for testing a partially assembled multi-die device, integrated circuit die and multi-die device Alexander Sebastian Biewenga 2014-09-09