ED

Eran Dvir

NI Nova Measuring Instruments: 8 patents #15 of 108Top 15%
Broadcom: 6 patents #1,767 of 9,346Top 20%
ZE Zestfinance: 3 patents #19 of 47Top 45%
EM Emc: 1 patents #1,879 of 3,345Top 60%
Overall (All Time): #245,538 of 4,157,543Top 6%
18
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
12265918 Systems and methods for enriching modeling tools and infrastructure with semantics Douglas C. Merrill, Armen Avedis Donigian, Sean Javad Kamkar, Evan Kriminger, Vishwaesh Rajiv +15 more 2025-04-01
11960981 Systems and methods for providing machine learning model evaluation by using decomposition Douglas C. Merrill, Michael Edward Ruberry, Ozan Sayin, Bojan Tunguz, Lin Song +12 more 2024-04-16
11847574 Systems and methods for enriching modeling tools and infrastructure with semantics Douglas C. Merrill, Armen Avedis Donigian, Sean Javad Kamkar, Evan Kriminger, Vishwaesh Rajiv +15 more 2023-12-19
11500696 Tracking changes that affect performance of deployed applications Adar Margalit 2022-11-15
10095560 Tracking changes that affect performance of deployed applications Adar Margalit 2018-10-09
9876673 Self-learning automated remediation of changes that cause performance degradation of applications Adar Margalit 2018-01-23
9766962 Correlating performance degradation of applications to specific changes made to applications Adar Margalit, Aner Mazursky, Hilik Paz 2017-09-19
9411847 Tracking changes that affect performance of deployed applications Adar Margalit 2016-08-09
9282005 IT infrastructure policy breach investigation interface Hanna Yehuda, Amanuel Ronen Artzi, Ju-Lien Lim 2016-03-08
8954387 Tracking changes that affect performance of deployed applications Adar Margalit 2015-02-10
7320265 Article transfer system Beniamin Shulman 2008-01-22
6860790 Buffer system for a wafer handling system 2005-03-01
6619144 Buffer system for a wafer handling system 2003-09-16
6543461 Buffer system for a wafer handling system field of the invention Eli Haimovich 2003-04-08
6368182 Apparatus for optical inspection of wafers during polishing Moshe Finarov, Eli Haimovich, Benjamin Shulman, Rony Abaron 2002-04-09
6368181 Apparatus for optical inspection of wafers during polishing Moshe Finarov, Eli Haimovich, Beniamin Shulman 2002-04-09
6212961 Buffer system for a wafer handling system 2001-04-10
6045433 Apparatus for optical inspection of wafers during polishing Eli Haimovich, Benjamin Shulman 2000-04-04