Benjamin Shulman — 3 Patents at Nova Measuring Instruments

Benjamin Shulman has been granted 3 US patents while listed as an inventor at Nova Measuring Instruments. The first was granted in 2000 and the most recent in November 2005. Benjamin Shulman ranks #1,328,092 of 4,157,543 US inventors in our database (top 31.9%). Patent records list Benjamin Shulman in Rehovot, IL.

Issued Patents All Time

Showing 1–3 of 3 patents

Patent #	Title	Co-Inventors	Date	Approx Value ⓘ
6964276	Wafer monitoring system	Yoav Alper	2005-11-15	$406,000
6368182	Apparatus for optical inspection of wafers during polishing	Eran Dvir, Moshe Finarov, Eli Haimovich, Rony Abaron	2002-04-09	$482,000
6045433	Apparatus for optical inspection of wafers during polishing	Eran Dvir, Eli Haimovich	2000-04-04

Benjamin Shulman — 3 Patents

Issued Patents All Time

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