Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6025917 | Polarization characteristic measuring method and apparatus | Masahisa Shiroshita, Takayuki Suga, Yoshitaro Nakano | 2000-02-15 |
| 5563706 | Interferometric surface profiler with an alignment optical member | Masato Shibuya, Yutaka Ichihara, Takashi Gemma, Keiji Inada | 1996-10-08 |
| 5561525 | Interferometer for observing the interference pattern of a surface under test utilizing an adjustable aperture stop | Takashi Gemma | 1996-10-01 |