Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5436464 | Foreign particle inspecting method and apparatus with correction for pellicle transmittance | Fuminori Hayano, Hideyuki Tashiro, Tsuneyuki Hagiwara | 1995-07-25 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5436464 | Foreign particle inspecting method and apparatus with correction for pellicle transmittance | Fuminori Hayano, Hideyuki Tashiro, Tsuneyuki Hagiwara | 1995-07-25 |