Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10267629 | Measurement probe unit for metrology applications | Frank Thys, Hans Thielemans, Laurens Van Horenbeek | 2019-04-23 |
| 9696146 | Optical scanning probe | Patrick Blanckaert, Frank Thys, Geert Vandenhoudt | 2017-07-04 |