Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10267629 | Measurement probe unit for metrology applications | Hans Thielemans, Raf Nysen, Laurens Van Horenbeek | 2019-04-23 |
| 9696146 | Optical scanning probe | Patrick Blanckaert, Raf Nysen, Geert Vandenhoudt | 2017-07-04 |
| 7428061 | Optical probe for scanning the features of an object and methods thereof | Bart Van Coppenolle, Lieven De Jonge, Kris Vallons | 2008-09-23 |
| 7009717 | Optical probe for scanning the features of an object and methods therefor | Bart P.E. van Coppenolle, Lieven De Jonge, Kris Vallons | 2006-03-07 |