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Hans Thielemans

NN Nikon Metrology Nv: 1 patents #17 of 42Top 45%
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Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
10267629 Measurement probe unit for metrology applications Frank Thys, Raf Nysen, Laurens Van Horenbeek 2019-04-23