Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5134365 | Probe card in which contact pressure and relative position of each probe end are correctly maintained | Kazumasa Okubo, Masao Okubo, Kiyoshi Sugaya | 1992-07-28 |
| 5055778 | Probe card in which contact pressure and relative position of each probe end are correctly maintained | Kazumasa Okubo, Masao Okubo, Kiyoshi Sugaya | 1991-10-08 |
| 4567433 | Complex probe card for testing a semiconductor wafer | Masao Ohkubo | 1986-01-28 |
| 4523144 | Complex probe card for testing a semiconductor wafer | Masao Okubo | 1985-06-11 |
| 4518914 | Testing apparatus of semiconductor wafers | Masao Okubo, Fumio Nakai, Oliver R. Garretson | 1985-05-21 |