Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4623839 | Probe device for testing an integrated circuit | Gordon Watson | 1986-11-18 |
| 4518914 | Testing apparatus of semiconductor wafers | Masao Okubo, Yasuro Yoshimitsu, Fumio Nakai | 1985-05-21 |