Issued Patents All Time
Showing 1–24 of 24 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11215971 | Support system and non-transitory computer readable medium | Yasuaki Miyazawa, Makoto Fuchigami, Kimihiro Wakabayashi, Yoshikazu Okamoto, Hiroshi Murano +4 more | 2022-01-04 |
| 10437657 | Support system and non-transitory computer readable medium | Kimihiro Wakabayashi, Yoshikazu Okamoto, Hiroshi Murano, Yasuaki Miyazawa, Mari Horie +2 more | 2019-10-08 |
| 6853208 | Vertical probe card | Kazumasa Okubo, Hiroshi Iwata | 2005-02-08 |
| 6392459 | Gate signal generating circuit, semiconductor evaluation apparatus, and semiconductor evaluating method | Dai Sasaki | 2002-05-21 |
| 6300783 | Probe, manufacture of same, and vertically operative type probe card assembly employing same | Kazumasa Okubo, Hiroshi Iwata | 2001-10-09 |
| 6294922 | Probe for testing a semiconductor integrated circuit | Kazumasa Okubo, Hiroshi Iwata | 2001-09-25 |
| 6013169 | Method of reforming a tip portion of a probe | Kazumasa Okubo, Hiroshi Iwata | 2000-01-11 |
| 5778291 | Image forming apparatus having a transfer member positional downstream of a nip portion | Noriaki Kojima, Nobukazu Takahashi | 1998-07-07 |
| 5729799 | Image forming method and apparatus having a semiconductive intermediate transfer member | Kazunori Numao, Noriaki Kojima, Nobukazu Takahashi | 1998-03-17 |
| 5670889 | Probe card for maintaining the position of a probe in high temperature application | Nobuyuki Murakami, Kouji Katahira, Hiroshi Iwata, Kazumasa Okubo | 1997-09-23 |
| 5422634 | Locking system using a key including an IC memory | — | 1995-06-06 |
| 5413789 | Antimicrobial composition of aluminosilicate coated silica gel | Zenji Hagiwara | 1995-05-09 |
| 5298252 | Antimicrobial composition having resistance to heat and weathers | Zenji Hagiwara | 1994-03-29 |
| 5244667 | Silica-gel based antimicrobial composition having an antimicrobial coat of aluminosilicate on the surface of silica gel | Zenji Hagiwara | 1993-09-14 |
| 5134365 | Probe card in which contact pressure and relative position of each probe end are correctly maintained | Kazumasa Okubo, Yasuro Yoshimitsu, Kiyoshi Sugaya | 1992-07-28 |
| 5055778 | Probe card in which contact pressure and relative position of each probe end are correctly maintained | Kazumasa Okubo, Yasuro Yoshimitsu, Kiyoshi Sugaya | 1991-10-08 |
| 4774413 | Ion emmissive head and ion beam irradiation device incorporating the same | Kiyoshi Sugaya, Toshinori Takagi, Junzo Ishikawa | 1988-09-27 |
| 4659397 | Manufacturing process for plate or forging of ferrite-austenite two-phase stainless steel | Mineo Kobayashi, Takeshi Yoshida, Masahiro Aoki, Masaaki Nagayama | 1987-04-21 |
| 4638217 | Fused metal ion source with sintered metal head | Kiyoshi Sugaya, Toshinori Takagi, Junzo Ishikawa | 1987-01-20 |
| 4585479 | Welding material of ferrite-austenite two-phase stainless steel and method of application | Masahiro Aoki, Kiichi Saito, Takeshi Yoshida, Noriyasu Ikeda, Masanori Takahashi +1 more | 1986-04-29 |
| 4523144 | Complex probe card for testing a semiconductor wafer | Yasuro Yoshimitsu | 1985-06-11 |
| 4518914 | Testing apparatus of semiconductor wafers | Yasuro Yoshimitsu, Fumio Nakai, Oliver R. Garretson | 1985-05-21 |
| 4381941 | Method for improving surface defect of specific steel resistant to concentrated nitric acid | Naoya Ito, Takeshi Yoshida, Masahiro Aoki, Masayoshi MIKI | 1983-05-03 |
| 4279648 | High silicon chromium nickel steel for strong nitric acid | Naoya Ito, Kiichi Saito, Takeshi Yoshida, Masahiro Aoki, Masayoshi MIKI | 1981-07-21 |