Issued Patents All Time
Showing 51–75 of 93 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7298963 | Time code generator and time code generating method, time code reader and time code reading method, and video recording and reproducing apparatus | Yoshihito Ueda, Tomokiyo Kato, Yoshiaki Tanaka | 2007-11-20 |
| 7290337 | Manufacturing method for frame body and frame body | Shoichi Takahashi, Kiyoshi Tamaru | 2007-11-06 |
| 7163849 | Fabrication method of semiconductor integrated circuit device | Toshiaki Sawada, Hirohiko Yamamoto | 2007-01-16 |
| 7109053 | Method for preparing optical device by dicing | Toshihiro Kuroda, Tooru Takahashi, Shigeyuki Yagi | 2006-09-19 |
| 6922775 | User support system for cryptographic communication in network systems | Yasutsugu Kuroda, Hideyuki Aikawa | 2005-07-26 |
| 6715345 | Coaxial probe with cantilever and scanning micro-wave microscope including the same | Norio Ookubo, Noriyuki Kodama, Yuichi Naitou | 2004-04-06 |
| 6584563 | User support system for cryptographic communication in network systems | Yasutsugu Kuroda, Hideyuki Aikawa | 2003-06-24 |
| 6583446 | Array of light-emitting elements and emission-altering elements | Masumi Taninaka, Mitsuhiko Ogihara, Hiroshi Hamano | 2003-06-24 |
| 6563321 | Method and apparatus for detecting line-shorts by potential and temperature distribution | — | 2003-05-13 |
| 6519373 | Image processing apparatus | — | 2003-02-11 |
| 6495856 | Semiconductor device having a test pattern same as conductive pattern to be tested and method for testing semiconductor device for short-circuit | — | 2002-12-17 |
| 6496788 | Data processing method and apparatus to determine killer ratio based on a variety of defect types | — | 2002-12-17 |
| 6445145 | Display device | Satoshi Oosuga | 2002-09-03 |
| 6346435 | Laminated substrate fabricated from semiconductor wafers bonded to each other without contact between insulating layer and semiconductor layer and process of fabrication thereof | Tomohiro Hamajima | 2002-02-12 |
| 6310448 | CRT display device having discharge current limiting resistors in high-voltage supply lines | Satoshi Oosuga, Yuusuke Kawamura | 2001-10-30 |
| 6274255 | Component for interior decoration of aircraft, and method of manufacturing the same | Tomio Hayakawa | 2001-08-14 |
| 6204075 | Method of detecting defects in a wiring process | — | 2001-03-20 |
| 6096433 | Laminated substrate fabricated from semiconductor wafers bonded to each other without contact between insulating layer and semiconductor layer and process of fabrication thereof | Tomohiro Hamajima | 2000-08-01 |
| 5999006 | Method of and apparatus for conducting analysis of buried oxides | — | 1999-12-07 |
| 5990964 | Method and apparatus for processing time code | Tetsuo Ogawa, Hiroshi Kiriyama, Tomokiyo Kato, Luke Freeman | 1999-11-23 |
| 5985681 | Method of producing bonded substrate with silicon-on-insulator structure | Tomohiro Hamajima | 1999-11-16 |
| 5894037 | Silicon semiconductor substrate and method of fabricating the same | Seiichi Shishiguchi | 1999-04-13 |
| 5886750 | Television receiver including shading correction without deteriorating S/N ratio | Satoshi Osuga, Yoshihiro Inamoto | 1999-03-23 |
| 5857044 | Method and apparatus for processing time code | Tetsuo Ogawa, Hiroshi Kiriyama, Tomokiyo Kato, Luke Freeman | 1999-01-05 |
| 5847438 | Bonded IC substrate with a high breakdown voltage and large current capabilities | Tomohiro Hamajima | 1998-12-08 |