YN

Yuichi Naitou

NE Nec: 2 patents #5,510 of 14,502Top 40%
Overall (All Time): #2,179,790 of 4,157,543Top 55%
2
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
6888135 Scanning probe microscope with probe formed by single conductive material Norio Ookubo 2005-05-03
6715345 Coaxial probe with cantilever and scanning micro-wave microscope including the same Norio Ookubo, Noriyuki Kodama, Hiroaki Kikuchi 2004-04-06