Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7062696 | Algorithmic test pattern generator, with built-in-self-test (BIST) capabilities, for functional testing of a circuit | Marc Erett, James Mears, Mark Sauerwald, Afif Farhat | 2006-06-13 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7062696 | Algorithmic test pattern generator, with built-in-self-test (BIST) capabilities, for functional testing of a circuit | Marc Erett, James Mears, Mark Sauerwald, Afif Farhat | 2006-06-13 |