Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7062696 | Algorithmic test pattern generator, with built-in-self-test (BIST) capabilities, for functional testing of a circuit | John Lee Barry, Marc Erett, Mark Sauerwald, Afif Farhat | 2006-06-13 |
| 5539400 | Ultra-low power, scan on demand keypad encoder | — | 1996-07-23 |