Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7062696 | Algorithmic test pattern generator, with built-in-self-test (BIST) capabilities, for functional testing of a circuit | John Lee Barry, Marc Erett, James Mears, Mark Sauerwald | 2006-06-13 |