Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9134346 | Method of making contact probe | Masahiro Aoyagi, Katsuya Kikuchi, Hiroshi Nakagawa, Hiroyuki Fujita, Shouichi Imai +1 more | 2015-09-15 |
| 7990165 | Contact probe and method of making the same | Masahiro Aoyagi, Katsuya Kikuchi, Hiroshi Nakagawa, Hiroyuki Fujita, Shoichi Imai +1 more | 2011-08-02 |
| 7833835 | Multi-layer fin wiring interposer fabrication process | Masahiro Aoyagi, Hiroshi Nakagawa, Kazuhiko Tokoro, Katsuya Kikuchi | 2010-11-16 |
| 7767574 | Method of forming micro metal bump | Yoshihiro Gomi, Masahiro Aoyagi, Hiroshi Nakagawa, Katsuya Kikuchi, Hirotaka Oosato | 2010-08-03 |
| 7414422 | System in-package test inspection apparatus and test inspection method | Masahiro Aoyagi, Hiroshi Nakagawa, Kazuhiko Tokoro, Katsuya Kikuchi, Hiroyuki Fujita +1 more | 2008-08-19 |
| 7227352 | Contact probe, measuring pad used for the contact probe, and method of manufacturing the contact probe | Masahiro Aoyagi, Hiroshi Nakagawa, Kazuhiko Tokoro, Katsuya Kikuchi, Shigeo Kiyota | 2007-06-05 |
| 7208966 | Contact probe, measuring pad used for the contact probe, and method of manufacturing the contact probe | Masahiro Aoyagi, Hiroshi Nakagawa, Kazuhiko Tokoro, Katsuya Kikuchi, Shigeo Kiyota | 2007-04-24 |