JP

John B. Putman

NI Nanotronics Imaging: 82 patents #2 of 43Top 5%
NL Nanotronics Health, Llc.: 5 patents #1 of 4Top 25%
📍 Intercession City, FL: #1 of 10 inventorsTop 10%
🗺 Florida: #181 of 67,251 inventorsTop 1%
Overall (All Time): #16,688 of 4,157,543Top 1%
93
Patents All Time

Issued Patents All Time

Showing 76–93 of 93 patents

Patent #TitleCo-InventorsDate
10481379 Method and system for automatically mapping fluid objects on a substrate Matthew C. Putman, John Cruickshank, Julie Orlando, Adele Frankel, Brandon Scott 2019-11-19
10467740 Systems, devices, and methods for providing feedback on and improving the accuracy of super-resolution imaging Matthew C. Putman, Vadim Pinskiy, Joseph Succar 2019-11-05
10437034 Unique oblique lighting technique using a brightfield darkfield objective and imaging method relating thereto Matthew C. Putman, Julie Orlando, Joseph G. Bulman 2019-10-08
10416426 Camera and specimen alignment to facilitate large area imaging in microscopy Matthew C. Putman, Brandon Scott, Dylan Fashbaugh 2019-09-17
10254214 Systems, devices, and methods for combined wafer and photomask inspection Randolph E. Griffith, Jeff Andresen, Scott Pozzi-Loyola, Michael Moskie, Steve Scranton +1 more 2019-04-09
10247910 Systems, devices and methods for automatic microscopic focus Matthew C. Putman, Julie Orlando, Dylan Fashbaugh 2019-04-02
10173246 Systems, apparatus, and methods for sorting components using illumination Jonathan Yancey, Justin Stanwix 2019-01-08
10169852 Systems, devices, and methods for providing feedback on and improving the accuracy of super-resolution imaging Matthew C. Putman, Vadim Pinskiy, Joseph Succar 2019-01-01
10146041 Systems, devices and methods for automatic microscope focus Matthew C. Putman, Vadim Pinskiy, Denis Sharoukhov 2018-12-04
10048477 Camera and specimen alignment to facilitate large area imaging in microscopy Matthew C. Putman, Brandon Scott, Dylan Fashbaugh 2018-08-14
9561566 Continuously scanning XY translation stage Matthew C. Putman 2017-02-07
9488819 Automatic microscopic focus system and method for analysis of transparent or low contrast specimens Matthew C. Putman, Jeffrey S. Archer, Julie Orlando 2016-11-08
7991245 Increasing image resolution method employing known background and specimen Matthew C. Putman 2011-08-02
6829951 Process for the physical testing of rubber Matthew C. Putman 2004-12-14
6795172 Method for preparing a cut surface in uncured rubber samples for measuring filter dispersion Matthew C. Putman, Joseph G. Bulman 2004-09-21
6775004 Measuring surface roughness to calculate filler dispersion in a polymer sample 2004-08-10
6681617 Variable eccentric rheometer system Bradley HENRY, Joseph G. Bulman 2004-01-27
4953406 Rheometer die assembly 1990-09-04