Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12386271 | Multi-layer calibration for empirical overlay measurement | Nigel P. Smith, Francis Scott Hoover, Nicholas James Keller | 2025-08-12 |
| 12013350 | Effective cell approximation model for logic structures | Nicholas James Keller | 2024-06-18 |
| 10488184 | Interferometric characterization of surface topography | John Allgair, Jonathan Peak, Timothy A. Johnson | 2019-11-26 |
| 7808643 | Determining overlay error using an in-chip overlay target | Nigel P. Smith | 2010-10-05 |
| 6939202 | Substrate retainer wear detection method and apparatus | Liam S. Roberts | 2005-09-06 |