JM

Jennifer L. Morningstar

NI Nanometrics Incorporated: 1 patents #69 of 127Top 55%
IBM: 1 patents #44,794 of 70,183Top 65%
📍 Hyde Park, NY: #143 of 223 inventorsTop 65%
🗺 New York: #67,335 of 115,490 inventorsTop 60%
Overall (All Time): #3,314,471 of 4,157,543Top 80%
1
Patents All Time

Issued Patents All Time

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
7473502 Imaging tool calibration artifact and method Chistopher P. Ausschnitt, Lewis A. Binns, Nigel P. Smith 2009-01-06