CA

Chistopher P. Ausschnitt

NI Nanometrics Incorporated: 1 patents #69 of 127Top 55%
IBM: 1 patents #44,794 of 70,183Top 65%
📍 Lexington, MA: #1,667 of 2,299 inventorsTop 75%
🗺 Massachusetts: #56,664 of 88,656 inventorsTop 65%
Overall (All Time): #3,314,472 of 4,157,543Top 80%
1
Patents All Time

Issued Patents All Time

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
7473502 Imaging tool calibration artifact and method Lewis A. Binns, Jennifer L. Morningstar, Nigel P. Smith 2009-01-06