HP

Hsin Lan Pang

NI Nanometrics Incorporated: 1 patents #69 of 127Top 55%
Overall (All Time): #3,357,161 of 4,157,543Top 85%
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Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
7379184 Overlay measurement target Nigel P. Smith, Yi-Sha Ku 2008-05-27