Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9355919 | Methods and systems for inspecting bonded wafers | Markus Estermann, Christoph Kappel, Lars Markwort | 2016-05-31 |
| 8778702 | Method of inspecting and processing semiconductor wafers | Lars Markwort, Christoph Kappel, Pierre-Yves Guittet | 2014-07-15 |