CK

Christoph Kappel

NG Nanda Technologies Gmbh: 2 patents #6 of 11Top 55%
IG Instrument Systems Optische Messtechnik Gmbh: 1 patents #5 of 22Top 25%
📍 Aschheim, DE: #22 of 63 inventorsTop 35%
Overall (All Time): #1,468,026 of 4,157,543Top 40%
3
Patents All Time

Issued Patents All Time

Showing 1–3 of 3 patents

Patent #TitleCo-InventorsDate
10295407 Light source having a controllable spectrum Felix Frank, Markus Estermann, Florian Schewe, Reto Haring, Amy M. Winkler +1 more 2019-05-21
9355919 Methods and systems for inspecting bonded wafers Markus Estermann, Reza Kharrazian, Lars Markwort 2016-05-31
8778702 Method of inspecting and processing semiconductor wafers Lars Markwort, Reza Kharrazian, Pierre-Yves Guittet 2014-07-15