Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9620332 | Charged particle beam substrate inspection using both vector and raster scanning | David K. Lam, Kevin M. Monahan, Cong Tran, Theodore A. Prescop | 2017-04-11 |
| 9466463 | Charged particle beam substrate inspection using both vector and raster scanning | David K. Lam, Kevin M. Monahan, Cong Tran, Theodore A. Prescop | 2016-10-11 |