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Clifford C. Weatherell

MI Mks Instruments: 1 patents #255 of 442Top 60%
Overall (All Time): #3,404,730 of 4,157,543Top 85%
1
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
6983215 RF metrology characterization for field installation and serviceability for the plasma processing industry David J. Coumou, Michael L. Kirk, Kevin P. Nasman 2006-01-03