Issued Patents All Time
Showing 1–11 of 11 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10444008 | Spherical shape measurement method and apparatus for rotating a sphere about first rotation axis and rotating a sphere hold mechanism about second rotation axis orthogonal to first rotation axis | Takeshi Hagino, Yuichiro Yokoyama | 2019-10-15 |
| 10415949 | Measuring probe | Satoshi Koga, Akinori Saito, Hiroyuki Kanamori, Nobuhiro Ishikawa | 2019-09-17 |
| 10393495 | Measuring probe | Satoshi Koga, Akinori Saito, Hiroyuki Kanamori, Nobuhiro Ishikawa | 2019-08-27 |
| 10352678 | Coefficient-of-thermal-expansion measurement method of dimension reference gauge, measuring device for coefficient of thermal expansion and reference gauge | Yuichiro Yokoyama, Takeshi Hagino | 2019-07-16 |
| 9297631 | Spherical-form measuring apparatus | Takeshi Hagino, Yuichiro Yokoyama | 2016-03-29 |
| 8913250 | Grazing incidence interferometer | Reiya Ootao | 2014-12-16 |
| 8879068 | Abscissa calibration jig and abscissa calibration method of laser interference measuring apparatus | Takeshi Hagino, Yuichiro Yokoyama | 2014-11-04 |
| 8441650 | Grazing incidence interferometer | Reiya Ootao | 2013-05-14 |
| 8379222 | Fizeau interferometer and measurement method using Fizeau interferometer | Takeshi Hagino, Yuichiro Yokoyama | 2013-02-19 |
| 7882891 | Precision surface plate | — | 2011-02-08 |
| 6559951 | Air refractometer | Jun Ishikawa, Morimasa Ueda, Hiroki Masuda | 2003-05-06 |