Issued Patents All Time
Showing 25 most recent of 28 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12054611 | Poly(phenylene ether), curable composition containing poly(phenylene ether), dry film, prepreg, cured object, laminate, and electronic component | Mami NOSAKA, Satoko MATSUMURA, Toshiaki Masuda | 2024-08-06 |
| 10429167 | Coordinate correction method and coordinate measuring machine | Hideyuki Nakagawa | 2019-10-01 |
| 10429166 | Coordinate measuring machine and coordinate correction method | Hideyuki Nakagawa | 2019-10-01 |
| 10422636 | Coordinate measuring machine and coordinate correction method | Hideyuki Nakagawa | 2019-09-24 |
| 10415949 | Measuring probe | Satoshi Koga, Akinori Saito, Hiroyuki Kanamori, Yutaka Kuriyama | 2019-09-17 |
| 10393495 | Measuring probe | Satoshi Koga, Akinori Saito, Hiroyuki Kanamori, Yutaka Kuriyama | 2019-08-27 |
| 10006803 | Sensor signal contact detector circuit | — | 2018-06-26 |
| 9746303 | Coordinate measuring machine and method for calculating correction matrix by coordinate measuring machine | Hideyuki Nakagawa | 2017-08-29 |
| 9719779 | Form measuring machine and form measuring method | Hideyuki Nakagawa | 2017-08-01 |
| 9683839 | Method of correcting measurement error of shape measuring apparatus, and shape measuring apparatus | Hideyuki Nakagawa | 2017-06-20 |
| 9464877 | Shape measuring apparatus and shape measurement error correction method | Hideyuki Nakagawa | 2016-10-11 |
| 9097504 | Shape measuring machine and method of correcting shape measurement error | Hideyuki Nakagawa | 2015-08-04 |
| 9091522 | Shape measuring machine and method of correcting shape measurement error | Hideyuki Nakagawa | 2015-07-28 |
| 9062958 | Image sensor, attitude detector, contact probe, and multi-sensing probe | Kazuhiko Hidaka | 2015-06-23 |
| 8332173 | Coordinate measuring machine | — | 2012-12-11 |
| 8229694 | Coordinate measuring machine | Hideyuki Nakagawa | 2012-07-24 |
| 8134325 | Controller | Hideyuki Nakagawa | 2012-03-13 |
| 7660688 | Surface-profile measuring instrument | Shingo Kiyotani | 2010-02-09 |
| 7471056 | Control device | Shingo Kiyotani | 2008-12-30 |
| 7464481 | Measuring apparatus, method of measuring surface texture and computer readable medium having program for measuring surface texture | — | 2008-12-16 |
| 7319909 | Position control device, measuring device and machining device | — | 2008-01-15 |
| 6937070 | Amplitude-detecting method and circuit | Kiyokazu Okamoto | 2005-08-30 |
| 6507404 | Method and apparatus for measuring optical wavelength | Nobuhisa Nishioki, Hirohisa Handa | 2003-01-14 |
| 6360176 | Touch signal probe | Nobuhisa Nishioki | 2002-03-19 |
| 6215225 | Non-directional touch signal probe | Kunitoshi Nishimura | 2001-04-10 |