Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12188765 | Adjustable update rate for measuring probe | Scott Allen Harsila, Bjorn Erik Bertil Jansson | 2025-01-07 |
| 11268874 | Defect judging unit of measuring probe and defect judging method thereof | Akinori Saito, Satoshi Koga | 2022-03-08 |
| 11047678 | Probe unit and measuring system | Satoshi Koga, Akinori Saito | 2021-06-29 |
| 10415949 | Measuring probe | Satoshi Koga, Akinori Saito, Yutaka Kuriyama, Nobuhiro Ishikawa | 2019-09-17 |
| 10393495 | Measuring probe | Satoshi Koga, Akinori Saito, Yutaka Kuriyama, Nobuhiro Ishikawa | 2019-08-27 |
| 8826718 | Method and rotary encoder for estimation of eccentric value | — | 2014-09-09 |
| 8576280 | Image measuring apparatus | Takeshi Saeki, Hirato Sonobe | 2013-11-05 |