| 12352704 |
Metrology system for measuring edge of circular workpiece |
Vahan Senekerimyan |
2025-07-08 |
| 12320635 |
Measuring probe with field generating coil configuration and temperature compensation |
Scott Allen Harsila |
2025-06-03 |
| 12204226 |
Metrology system configured to illuminate and measure apertures of workpieces |
Paul Gerard Gladnick, Pavel Ivanovich Nagornykh |
2025-01-21 |
| 12174013 |
Measuring probe with sensing coils and temperature compensation |
Scott Allen Harsila |
2024-12-24 |
| 12011785 |
Laser-processing apparatus, methods of operating the same, and methods of processing workpieces using the same |
James Brookhyser, Zachary J. Dunn |
2024-06-18 |
| 11740064 |
Inductive position detection configuration for indicating a measurement device stylus position |
— |
2023-08-29 |
| 11733021 |
Modular configuration for coordinate measuring machine probe |
Dawn Alisa Keehnel, Scott Ellis Hemmings, Scott Allen Harsila |
2023-08-22 |
| 11713956 |
Shielding for sensor configuration and alignment of coordinate measuring machine probe |
Dawn Alisa Keehnel, Scott Ellis Hemmings, Scott Allen Harsila |
2023-08-01 |
| 11644298 |
Inductive position detection configuration for indicating a measurement device stylus position |
— |
2023-05-09 |
| 11644299 |
Inductive position sensor signal gain control for coordinate measuring machine probe |
Scott Allen Harsila, Scott Ellis Hemmings, Andrew Michael Patzwald |
2023-05-09 |
| 11543899 |
Inductive position detection configuration for indicating a measurement device stylus position and including coil misalignment compensation |
— |
2023-01-03 |
| 10914570 |
Inductive position detection configuration for indicating a measurement device stylus position |
Ted Staton Cook, Scott Allen Harsila, Kazuhiko Hidaka |
2021-02-09 |