Issued Patents All Time
Showing 26–37 of 37 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5521863 | Non-volatile semiconductor memory device incorporating data latch and address counter for page mode programming | Shinichi Kobayashi, Takeshi Nakayama, Tomoshi Futatsuya, Yasushi Terada | 1996-05-28 |
| 5485421 | Non-volatile semiconductor memory device incorporating data latch and address counter for page mode programming | Shinichi Kobayashi, Takeshi Nakayama, Tomoshi Futatsuya, Yasushi Terada | 1996-01-16 |
| 5428568 | Electrically erasable and programmable non-volatile memory device and a method of operating the same | Shinichi Kobayashi, Yasushi Terada, Takeshi Nakayama, Tomoshi Futatsuya | 1995-06-27 |
| 5402382 | Nonvolatile semiconductor memory device capable of erasing by a word line unit | Yasushi Terada, Takeshi Nakayama, Shinichi Kobayashi, Tomoshi Futatsuya | 1995-03-28 |
| 5371705 | Internal voltage generator for a non-volatile semiconductor memory device | Takeshi Nakayama, Yasushi Terada, Tomoshi Futatsuya, Shinichi Kobayashi | 1994-12-06 |
| 5363330 | Non-volatile semiconductor memory device incorporating data latch and address counter for page mode programming | Shinichi Kobayashi, Takeshi Nakayama, Tomoshi Futatsuya, Yasushi Terada | 1994-11-08 |
| 5347490 | Nonvolatile semiconductor memory device | Yasushi Terada, Takeshi Nakayama, Shinichi Kobayashi, Masanori Hayashikoshi | 1994-09-13 |
| 5297096 | Nonvolatile semiconductor memory device and data erasing method thereof | Yasushi Terada, Takeshi Nakayama, Shinichi Kobayashi, Masanori Hayashikoshi, Tomoshi Futatsuya | 1994-03-22 |
| 5283758 | Non-volatile semiconductor memory device | Takeshi Nakayama, Yasushi Terada, Kazuo Kobayashi, Masanori Hayashikoshi | 1994-02-01 |
| 5233610 | Semiconductor memory device having error correcting function | Takeshi Nakayama, Yasushi Terada, Masanori Hayashikoshi, Kazuo Kobayashi | 1993-08-03 |
| 5132928 | Divided word line type non-volatile semiconductor memory device | Masanori Hayashikoshi, Yasushi Terada, Kazuo Kobayashi, Takeshi Nakayama | 1992-07-21 |
| 4970727 | Semiconductor integrated circuit having multiple self-test functions and operating method therefor | Masanori Hayashikoshi, Takeshi Nakayama, Kazuo Kobayashi, Yasushi Terada | 1990-11-13 |