Issued Patents All Time
Showing 1–22 of 22 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7079060 | Test circuit for evaluating characteristic of analog signal of device | Toshiaki Tarui, Masaru Sugimoto, Hisaya Mori | 2006-07-18 |
| 7058865 | Apparatus for testing semiconductor integrated circuit | Hisaya Mori, Hisayoshi Hanai | 2006-06-06 |
| 6990614 | Data storage apparatus and data measuring apparatus | Hidekazau Nagasawa, Kazushi Sugiura, Hisaya Mori | 2006-01-24 |
| 6954079 | Interface circuit coupling semiconductor test apparatus with tested semiconductor device | Masaru Sugimoto, Hidekazu Nagasawa | 2005-10-11 |
| 6934648 | Jitter measurement circuit for measuring jitter of measurement target signal on the basis of sampling data string obtained by using ideal cyclic signal | Hisayoshi Hanai, Hisaya Mori | 2005-08-23 |
| 6900627 | Apparatus and method for testing semiconductor integrated circuit | Hisaya Mori, Shinji Yamada | 2005-05-31 |
| 6714888 | Apparatus for testing semiconductor integrated circuit | Hisaya Mori, Shinji Yamada | 2004-03-30 |
| 6690189 | Apparatus and method for testing semiconductor integrated circuit | Hisaya Mori, Shinji Yamada | 2004-02-10 |
| 6661248 | Tester for semiconductor integrated circuits | Hisaya Mori, Shinji Yamada, Hisayoshi Hanai | 2003-12-09 |
| 6653855 | External test auxiliary device to be used for testing semiconductor device | Hisaya Mori, Shinji Yamada | 2003-11-25 |
| 6651023 | Semiconductor test apparatus, and method of testing semiconductor device | Hisaya Mori, Shinji Yamada | 2003-11-18 |
| 6642736 | Tester for semiconductor integrated circuits and method for testing semiconductor integrated circuits | Hisaya Mori, Shinji Yamada | 2003-11-04 |
| 6634004 | Threshold analysis system capable of deciding all threshold voltages included in memory device through single processing | Shinji Yamada, Hisaya Mori | 2003-10-14 |
| 6628137 | Apparatus and method for testing semiconductor integrated circuit | Hisaya Mori, Shinji Yamada | 2003-09-30 |
| 6587975 | Semiconductor test apparatus and method | Hisaya Mori | 2003-07-01 |
| 6546525 | LSI testing apparatus | Masaru Sugimoto, Yasuhide Nakase | 2003-04-08 |
| 6522126 | Semiconductor tester, and method of testing semiconductor using the same | Hisayoshi Hanai, Yasuhiro Mabuchi | 2003-02-18 |
| 6456102 | External test ancillary device to be used for testing semiconductor device, and method of testing semiconductor device using the device | Hisaya Mori, Shinji Yamada | 2002-09-24 |
| 6281698 | LSI testing apparatus and timing calibration method for use therewith | Masaru Sugimoto, Yasuhide Nakase, Tomohiro Nishimura | 2001-08-28 |
| 5959463 | Semiconductor test apparatus for measuring power supply current of semiconductor device | Kazuya Fujita | 1999-09-28 |
| 5485114 | Semiconductor integrated circuit with internal compensation for changes in time delay | Naomi Higashino | 1996-01-16 |
| 5172047 | Semiconductor test apparatus | — | 1992-12-15 |