Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6546525 | LSI testing apparatus | Masaru Sugimoto, Teruhiko Funakura | 2003-04-08 |
| 6281698 | LSI testing apparatus and timing calibration method for use therewith | Masaru Sugimoto, Tomohiro Nishimura, Teruhiko Funakura | 2001-08-28 |