Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7058865 | Apparatus for testing semiconductor integrated circuit | Hisaya Mori, Teruhiko Funakura | 2006-06-06 |
| 6934648 | Jitter measurement circuit for measuring jitter of measurement target signal on the basis of sampling data string obtained by using ideal cyclic signal | Teruhiko Funakura, Hisaya Mori | 2005-08-23 |
| 6661248 | Tester for semiconductor integrated circuits | Hisaya Mori, Shinji Yamada, Teruhiko Funakura | 2003-12-09 |
| 6522126 | Semiconductor tester, and method of testing semiconductor using the same | Teruhiko Funakura, Yasuhiro Mabuchi | 2003-02-18 |
| 6492923 | Test system and testing method using memory tester | Takato Inoue, Masatoshi Maga, Shinji Yamada | 2002-12-10 |