Issued Patents All Time
Showing 101–125 of 211 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7183167 | Semiconductor device having a trench isolation and method of fabricating the same | Toshiaki Iwamatsu, Takashi Ipposhi, Takuji Matsumoto | 2007-02-27 |
| 7176515 | Semiconductor device including insulated gate type transistor and insulated gate type capacitance having protruded portions | Hiroyuki Takashino, Toshihide Oka | 2007-02-13 |
| 7164172 | Semiconductor device and method of manufacturing same | Shigeto Maegawa, Takuji Matsumoto | 2007-01-16 |
| 7157765 | Semiconductor device including insulated gate type transistor with pocket regions and insulated gate type capacitor with no region of reverse conductivity type | Hiroyuki Takashiho, Toshihide Oka | 2007-01-02 |
| 7144764 | Method of manufacturing semiconductor device having trench isolation | Takuji Matsumoto, Mikio Tsujiuchi, Toshiaki Iwamatsu, Yuuichi Hirano, Shigeto Maegawa | 2006-12-05 |
| 7129543 | Method of designing semiconductor device, semiconductor device and recording medium | Yasuo Yamaguchi | 2006-10-31 |
| 7112835 | Semiconductor device including a capacitance | Takashi Ipposhi, Yuuichi Hirano | 2006-09-26 |
| 7112854 | Thin-film transistor and method of fabricating the same | Shigeto Maegawa, Takashi Ipposhi, Toshiaki Iwamatsu, Il Jung Kim, Kazuhito Tsutsumi +4 more | 2006-09-26 |
| 7109553 | Semiconductor device and method of manufacturing same | Takuji Matsumoto, Hirokazu Sayama, Toshiaki Iwamatsu, Kazunobu Ota | 2006-09-19 |
| 7105389 | Method of manufacturing semiconductor device having impurity region under isolation region | Toshiaki Iwamatsu, Takashi Ipposhi | 2006-09-12 |
| 7053451 | Semiconductor device having impurity region under isolation region | Toshiaki Iwamatsu, Takashi Ipposhi | 2006-05-30 |
| 7045867 | Semiconductor device of reduced gate overlap capacitance and method of manufacturing the semiconductor device | Hai Dang, Takuji Matsumoto, Yuuichi Hirano | 2006-05-16 |
| 7005705 | MOS transistor on an SOI substrate with a body contact and a gate insulating film with variable thickness | Takuji Matsumoto, Toshiaki Iwamatsu, Takashi Ipposhi | 2006-02-28 |
| 7001822 | Semiconductor device formed on insulating layer and method of manufacturing the same | Toshiaki Iwamatsu, Yasuo Yamaguchi, Shoichi Miyamoto, Akihiko Furukawa, Yasuo Inoue | 2006-02-21 |
| 6958266 | Semiconductor device, method of manufacturing same and method of designing same | Yasuo Yamaguchi, Shigeto Maegawa, Takashi Ipposhi, Toshiaki Iwamatsu, Yuuichi Hirano +2 more | 2005-10-25 |
| 6953979 | Semiconductor device, method of manufacturing same and method of designing same | Yasuo Yamaguchi, Shigeto Maegawa, Takashi Ipposhi, Toshiaki Iwamatsu, Yuuichi Hirano +2 more | 2005-10-11 |
| 6882006 | Semiconductor device and method of manufacturing the same | Yasuo Yamaguchi, Hirotada Kuriyama, Shigeto Maegawa | 2005-04-19 |
| 6875663 | Semiconductor device having a trench isolation and method of fabricating the same | Toshiaki Iwamatsu, Takashi Ipposhi, Takuji Matsumoto | 2005-04-05 |
| 6870226 | Semiconductor device and method of manufacturing same | Shigeto Maegawa, Takuji Matsumoto | 2005-03-22 |
| 6858918 | Semiconductor device including a capacitance | Takashi Ipposhi, Yuuichi Hirano | 2005-02-22 |
| 6841400 | Method of manufacturing semiconductor device having trench isolation | Takuji Matsumoto, Mikio Tsujiuchi, Toshiaki Iwamatsu, Yuuichi Hirano, Shigeto Maegawa | 2005-01-11 |
| 6815295 | Method of manufacturing field effect transistors | Shuichi Ueno, Yoshinori Okumura, Shigeto Maegawa | 2004-11-09 |
| 6806537 | Semiconductor device having offset insulation film formed on insulation film, and method of manufacturing the same | Takuji Matsumoto, Hirokazu Sayama, Toshiaki Iwamatsu, Kazunobu Ota | 2004-10-19 |
| 6794717 | Semiconductor device and method of manufacturing the same | Takuji Matsumoto, Toshiaki Iwamatsu, Takashi Ipposhi | 2004-09-21 |
| 6787855 | Semiconductor device and method of manufacturing same | Yuuichi Hirano, Shigeto Maegawa | 2004-09-07 |