Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8435417 | Method of manufacturing semiconductor device | Kazunari Nakata, Kaoru Motonami, Atsushi Narazaki, Shigeto Honda, Ryoichi Fujii +1 more | 2013-05-07 |
| 7065238 | Defect inspection method and defect inspection equipment | Koichi Sakurai, Kazuhiro Oka, Hiroyuki Ishii, Katsuhiro Fujiyoshi | 2006-06-20 |
| 6829047 | Defect detection system | Tatsuya Fujii, Koichi Sakurai | 2004-12-07 |