Issued Patents All Time
Showing 1–25 of 33 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12021118 | Semiconductor device | Kazuya KONISHI, Yusuke FUKADA, Ryu Kamibaba, Mariko Umeyama, Masayoshi Tarutani | 2024-06-25 |
| 10892352 | Power semiconductor device | Akihiko Furukawa, Shoichi Orita, Hiroki Muraoka, Tsuyoshi Kawakami, Yuji Murakami | 2021-01-12 |
| 10797169 | Silicon carbide semiconductor device and power conversion apparatus | Kazuya ISHIBASHI, Yasuhiro Kagawa, Kensuke Taguchi | 2020-10-06 |
| 10431658 | Silicon carbide semiconductor device, manufacturing method therefor and power conversion apparatus | Yasuhiro Kagawa, Yutaka Fukui, Katsutoshi SUGAWARA | 2019-10-01 |
| 10243067 | Semiconductor device and method for manufacturing the same | Kazuya KONISHI, Yusuke FUKADA | 2019-03-26 |
| 10192977 | Power semiconductor device | Akihiko Furukawa, Shoichi Orita, Hiroki Muraoka, Tsuyoshi Kawakami, Yuji Murakami | 2019-01-29 |
| 10176994 | Semiconductor device and method of manufacturing the same | Kenji Suzuki, Ryu Kamibaba, Yusuke FUKADA, Katsumi Nakamura | 2019-01-08 |
| 9799648 | Semiconductor device | Shinya SONEDA | 2017-10-24 |
| 9431479 | High breakdown voltage semiconductor device having a resurf layer | Shigeto Honda, Kaoru Motonami | 2016-08-30 |
| 9219113 | Semiconductor device having breakdown voltage enhancement structure | Takuya Takahashi, Tetsuo Takahashi | 2015-12-22 |
| 9105486 | Semiconductor device | — | 2015-08-11 |
| 8884383 | Semiconductor device and method of testing the same | — | 2014-11-11 |
| 8809969 | Semiconductor device | Yoichiro Tarui, Ryoichi Fujii | 2014-08-19 |
| 8742474 | Power semiconductor device having an active region and an electric field reduction region | Yoshiaki Hisamoto, Hitoshi Uemura | 2014-06-03 |
| 8618604 | Semiconductor device and method of manufacturing the same | — | 2013-12-31 |
| 8593167 | Semiconductor device test method and apparatus, and semiconductor device | — | 2013-11-26 |
| 8552468 | Power semiconductor device | — | 2013-10-08 |
| 8530966 | Semiconductor device | Hisaaki Yoshida, Kazuaki Higashi | 2013-09-10 |
| 8519733 | Method of measuring characteristics of a semiconductor element and method of manufacturing a semiconductor device | — | 2013-08-27 |
| 8450183 | Power semiconductor device and method of manufacturing the same | Ryoichi Fujii, Shigeto Honda, Kaoru Motonami | 2013-05-28 |
| 8435417 | Method of manufacturing semiconductor device | Kazunari Nakata, Kaoru Motonami, Ayumu Onoyama, Shigeto Honda, Ryoichi Fujii +1 more | 2013-05-07 |
| 8247867 | Semiconductor device | Kazunari Nakata, Shigeto Honda, Kaoru Motonami | 2012-08-21 |
| 8178365 | Method of manufacturing semiconductor device | Yukio Matsushita, Masashi Osaka, Shunsuke Sakamoto | 2012-05-15 |
| 8124533 | Method of manufacturing power semiconductor device | — | 2012-02-28 |
| 7741655 | Semiconductor device | Kenji Hatori | 2010-06-22 |